Random periodic replacement models after the expiry of 2D-warranty
Lijun Shang, Qingan Qiu, Xin Wang
Topics & Concepts
WarrantyReliability (semiconductor)Reliability engineeringComputer scienceEngineeringQuantum mechanicsPolitical sciencePhysicsLawPower (physics)Reliability and Maintenance OptimizationSoftware Reliability and Analysis ResearchStatistical Distribution Estimation and Applications