A gray correlation based Bayesian network model for fault source diagnosis of multistage process – Small sample manufacturing system
Kaiyang Chu, Rui Liu, Guijiang Duan
Topics & Concepts
Bayesian networkData miningComputer scienceFault (geology)Factory (object-oriented programming)Process (computing)Bayesian probabilitySample (material)Reliability engineeringQuality assuranceArtificial intelligenceEngineeringMachine learningChemistryExternal quality assessmentProgramming languageChromatographyOperations managementSeismologyOperating systemGeologyManufacturing Process and OptimizationFault Detection and Control SystemsIndustrial Vision Systems and Defect Detection