Inverse Gaussian process based reliability analysis for constant-stress accelerated degradation data
Peihua Jiang, Bing Xing Wang, Xiaofei Wang, Zonghao Zhou
Topics & Concepts
Inverse Gaussian distributionConfidence intervalReliability (semiconductor)MathematicsStatisticsInterval (graph theory)Applied mathematicsGaussian processInterval estimationInverseGaussianConstant (computer programming)PercentileDegradation (telecommunications)Coverage probabilityMonte Carlo methodStress (linguistics)Inverse problemAlgorithmComputer scienceMathematical analysisDistribution (mathematics)Power (physics)PhysicsCombinatoricsGeometryLinguisticsQuantum mechanicsTelecommunicationsProgramming languagePhilosophyReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design