Prediction of the normal spectral emissivity of metals with different surface roughness using a modified ray-tracing method
Shi‐Xiong Liu, Qitai Eri, Bo Kong, Yue Zhou
Topics & Concepts
EmissivityRay tracing (physics)Materials scienceSurface roughnessSurface finishSurface (topology)OpticsComposite materialGeometryPhysicsMathematicsThermography and Photoacoustic TechniquesSurface Roughness and Optical MeasurementsCalibration and Measurement Techniques