Direct characterization of shear phonons in layered materials by mechano-Raman spectroscopy
Susu Fang, Sai Duan, Xingzhi Wang, Sijie Chen, Li Li, Hua Li, Baichuan Jiang, Chuanhui Liu, Nanyang Wang, Lei Zhang, Xinglin Wen, Yagang Yao, Jun Zhang, Daiqian Xie, Yi Luo, Weigao Xu
Topics & Concepts
PhononRaman spectroscopyPlasmonMaterials scienceSpectroscopyRaman scatteringOptoelectronicsCharacterization (materials science)Crystal (programming language)OpticsCondensed matter physicsNanotechnologyPhysicsComputer scienceProgramming languageQuantum mechanicsMechanical and Optical ResonatorsThermal properties of materialsForce Microscopy Techniques and Applications