Reduction of dislocations in α-Ga<sub>2</sub>O<sub>3</sub> epilayers grown by halide vapor-phase epitaxy on a conical frustum-patterned sapphire substrate
Hoki Son, Ye-Ji Choi, Soon‐Ku Hong, Ji-Hyeon Park, Dae‐Woo Jeon
Abstract
The compound α-Ga 2 O 3 is an ultra-wide-bandgap semiconductor and possesses outstanding properties such as a high breakdown voltage and symmetry compared with other phases. It has been studied for applications in high-performance power devices. However, it is difficult to obtain a high-quality thin films because α-Ga 2 O 3 can only grow heteroepitaxially, which results in residual stress generation owing to lattice mismatch and thermal expansion between the substrate and α-Ga 2 O 3 . To overcome this, α-Ga 2 O 3 was grown on a conical frustum-patterned sapphire substrate by halide vapor-phase epitaxy. The surface morphology was crack-free and flat. The α-Ga 2 O 3 grown on a frustum-patterned substrate and a conventional sapphire substrate at 500°C exhibited full-width at half-maxima of 961 and 1539 arcsec, respectively, for 10–12 diffraction. For the former substrate, lateral growth on the pattern and threading dislocation bending towards the pattern suppressed the propagation of threading dislocations generated at the interface, which reduced the threading dislocation propagation to the surface by half compared with that on the latter conventional substrate. The results suggest that conical frustum-patterned sapphire substrates have the potential to produce high-quality α-Ga 2 O 3 epilayers.