A consistent calibration across three wheat models to simulate wheat yield and phenology in China
Huan Liu, Diego Noleto Luz Pequeno, Ixchel M. Hernández-Ochoa, Timothy J. Krupnik, Kai Sonder, Wei Xiong, Yinlong Xu
Topics & Concepts
DSSATCalibrationPhenologyConsistency (knowledge bases)Yield (engineering)Simulation modelingEnvironmental scienceCrop simulation modelBest linear unbiased predictionScale (ratio)Crop yieldMathematicsStatisticsComputer scienceSelection (genetic algorithm)AgronomyBiologyGeographyMachine learningMaterials scienceCartographyMetallurgyMathematical economicsGeometryClimate change impacts on agricultureGreenhouse Technology and Climate ControlCrop Yield and Soil Fertility