Optimizing broad ion beam polishing of zircaloy-4 for electron backscatter diffraction analysis
Ning Fang, Ruth Birch, T. Ben Britton
Topics & Concepts
PolishingZirconium alloyElectron backscatter diffractionMaterials scienceFocused ion beamCladding (metalworking)Ion beamElectron diffractionIon milling machineMicrostructureAlloySample preparationCathode rayDiffractionIonMetallurgyOpticsElectronBeam (structure)NanotechnologyChemistryNuclear physicsLayer (electronics)ChromatographyPhysicsOrganic chemistryIon-surface interactions and analysisNuclear Materials and PropertiesFusion materials and technologies