Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study
Chen–Fu Chien, Hsin-Jung Wu
Topics & Concepts
TroubleshootingReliability engineeringEngineeringQuality (philosophy)Fault (geology)Integrated circuitProcess (computing)WaferFault detection and isolationSemiconductor device fabricationElectronic engineeringComputer scienceElectrical engineeringSeismologyActuatorPhilosophyEpistemologyGeologyOperating systemRough Sets and Fuzzy LogicIndustrial Vision Systems and Defect DetectionImbalanced Data Classification Techniques