First Observation of New Flat Line Fano Profile via an X-Ray Planar Cavity
Zi-Ru Ma, Xin‐Chao Huang, Tian-Jun Li, Hongchang Wang, Genchang Liu, Zhanshan Wang, Bo Li, Wenbin Li, Lin‐Fan Zhu
Abstract
A new Fano profile of a flat line is achieved experimentally by manipulating the relative amplitude of the continuum path, when q takes the pure imaginary number of -i in the x-ray regime. The underlying mechanism is that the interference term in the scattering will cancel the discrete term exactly. This new Fano profile renders only an observable continuum along with an invisible response to the discrete state of atomic resonance. The results suggest not only a different strategy to invisibility studies which provides a possible tool to identify weaker structures hidden by the strong white line, but also a new scenario to enrich the manipulations of two-path interference and nonlinear Fano resonance.