X-ray Diffraction Analysis of Hexagonal Klockmannite CuSe Nanoparticles for Photodetectors under UV Light
K. D. Patel, K. D. Patel, G. K. Solanki, K. D. Patel, K. D. Patel, V. M. Pathak
Abstract
The CuSe nanoparticles are synthesized from direct vapor transport-grown CuSe compound using the sonochemical exfoliation technique. The chemical composition, crystalline phase, morphological analysis, optical properties, vibrational modes, and oxidation states of the elements of the synthesized nanoparticles are verified by energy-dispersive analysis of X-rays (EDAX), elemental mapping, X-ray diffraction (XRD), high-resolution transmission electron microscopy (HR-TEM), ultraviolet diffused reflectance spectroscopy (UV-DRS) - photoluminescence measurements (PL), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS). Here, the particle sizes and the intrinsic strain of the XRD peak broadening analysis were investigated using the Williamson–Hall method (W–H), size–strain plot, and Halder–Wagner process (H–W). In addition, for the determination of physical and microstructural parameters such as strain, stress, and energy density, various models, that is, uniform deformation model, uniform stress deformation model, uniform deformation energy density model, have been well-thought-out in the W–H method. The average particle size calculated by the methods of W–H, size–strain, and H–W is compared to that calculated using HR-TEM and particle size analysis. Photodetectors based on CuSe nanoparticles are fabricated and studied under UV light with an on/off period of 10 s. The device showed excellent photoconductivity, photocurrent, responsivity, specific detectivity, external quantum efficiency, and good response time. The results demonstrated that CuSe nanoparticles possess excellent optoelectronic properties and have potential applications under UV light conditions.