Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography
Felix Wagner, Reika Watanabe, Ruud Schampers, Digvijay Singh, Hans Persoon, Miroslava Schaffer, Peter Fruhstorfer, Jürgen M. Plitzko, Elizabeth Villa
Topics & Concepts
Focused ion beamCryo-electron microscopyMaterials scienceMicroscopyMicroscopeNanotechnologyElectron microscopeCryo-electron tomographyResolution (logic)Context (archaeology)Fluorescence microscopeOpticsComputer scienceChemistryTomographyFluorescenceIonPhysicsArtificial intelligenceBiologyBiochemistryOrganic chemistryPaleontologyAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesPhotovoltaic Systems and Sustainability