Detecting and Classifying Parametric Faults in Analog Circuits Using an Optimized Attention Neural Networks
S. Karthi, K. Kavitha
Topics & Concepts
Parametric statisticsArtificial neural networkComputer scienceAnalogue electronicsBiological neural networkElectronic circuitArtificial intelligencePattern recognition (psychology)Machine learningMathematicsEngineeringElectrical engineeringStatisticsVLSI and Analog Circuit TestingAdvancements in Semiconductor Devices and Circuit DesignNeural Networks and Applications