High Quality Factor Silicon Membrane Metasurface for Intensity-Based Refractive Index Sensing
Andrea Tognazzi, Davide Rocco, Marco Gandolfi, Andrea Locatelli, Luca Carletti, Costantino De Angelis
Abstract
We propose a new sensing device based on all-optical nano-objects placed in a suspended periodic array. We demonstrate that the intensity-based sensing mechanism can measure environment refractive index change of the order of 1.8×10−6, which is close to record efficiencies in plasmonic devices.
Topics & Concepts
Refractive indexPlasmonMaterials scienceIntensity (physics)SiliconOpticsOptoelectronicsQuality (philosophy)Light intensityMeasure (data warehouse)Computer sciencePhysicsDatabaseQuantum mechanicsPlasmonic and Surface Plasmon ResearchPhotonic and Optical DevicesAdvanced Fiber Optic Sensors