Single-pixel detecting of rotating object using Zernike illumination
Wenchang Lai, Guozhong Lei, Meng Qi, Dongfeng Shi, Wenda Cui, Yan Wang, Kai Han
Abstract
In this paper, a single-pixel imaging technique based on Zernike illumination is firstly introduced to detect rotating object. By measuring the specific Zernike moments through a single-pixel detector, the rotation angle of rotating object can be obtained. This method requires only four differential Zernike patterns to illuminate a rotating object in one frame. And the Zernike moments can be calculated from the corresponding reflected intensities collected by the single-pixel detector. Then the rotation angle can be calculated from the phase change of Zernike moments due to the rotation invariant. By theoretical simulation and experimental demonstration, the Zernike moments of the targets are successfully obtained through single-pixel imaging system. The rotation angles are calculated from the measured Zernike moments and agree well with the actual rotation angles. The errors of simulated rotation angle are below 1°. And the RMSEs of the experimental results are below 3° for binary images and below 4° for gray images. The proposed scheme provides a new method for applications on detecting rotating object.