Reliability of 28nm embedded RRAM for consumer and industrial products
Christian Peters, Frank Adler, Karl Hofmann, J. Otterstedt
Abstract
We discuss high statistic reliability data of embedded RRAM in a 28nm advanced logic foundry process coming from test devices and first products to demonstrate the matureness und usability of the embedded emerging memory for consumer and industrial products. We compare failure modes and counter measures with embedded flash from the previous generations. Overall, 28nm-embedded RRAM is an adequate successor of embedded flash.
Topics & Concepts
Resistive random-access memoryReliability (semiconductor)Computer scienceEmbedded systemSuccessor cardinalReliability engineeringFlash (photography)Flash memoryEngineeringElectrical engineeringPhysicsArtQuantum mechanicsMathematicsVoltageVisual artsMathematical analysisPower (physics)Semiconductor materials and devicesFerroelectric and Negative Capacitance DevicesIntegrated Circuits and Semiconductor Failure Analysis