Litcius/Paper detail

Dependence of InGaZnO and SnO2 thin film stacking sequence for the resistive switching characteristics of conductive bridge memory devices

Asif Ali, Yawar Abbas, Haider Abbas, Yu-Rim Jeon, Sajjad Hussain, Bilal Abbas Naqvi, Changhwan Choi, Jongwan Jung

2020Applied Surface Science42 citationsDOI

Topics & Concepts

StackingMaterials scienceElectrolyteOptoelectronicsResistive random-access memoryElectrodeElectrical conductorIonSequence (biology)NanotechnologyChemistryComposite materialBiochemistryPhysical chemistryOrganic chemistryAdvanced Memory and Neural ComputingTransition Metal Oxide NanomaterialsCCD and CMOS Imaging Sensors