Te-Vacancy-Induced Surface Collapse and Reconstruction in Antiferromagnetic Topological Insulator MnBi<sub>2</sub>Te<sub>4</sub>
Fuchen Hou, Qiushi Yao, Chun-Sheng Zhou, Xiao‐Ming Ma, Mengjiao Han, Yu‐Jie Hao, Xuefeng Wu, Xunya Jiang, Hongyi Sun, Chang Liu, Yüe Zhao, Qihang Liu, Junhao Lin
Abstract
few-layer devices.
Topics & Concepts
Topological insulatorAntiferromagnetismCondensed matter physicsSurface reconstructionvan der Waals forceVacancy defectAnnealing (glass)Materials scienceSurface layerTopology (electrical circuits)TelluriumQuantumSurface (topology)NanotechnologyPhysicsLayer (electronics)GeometryQuantum mechanicsMoleculeMetallurgyMathematicsComposite materialCombinatoricsTopological Materials and PhenomenaGraphene research and applicationsAdvanced Condensed Matter Physics