Style Adaptation module: Enhancing detector robustness to inter-manufacturer variability in surface defect detection
Chen Li, Xiakai Pan, Peiyuan Zhu, Shidong Zhu, Chengwei Liao, Haoyang Tian, Xiang Qian, Xiu Li, Xiu Li, Xiaohao Wang, Xinghui Li, Xinghui Li, Xinghui Li
Topics & Concepts
Robustness (evolution)DetectorAdaptation (eye)Computer scienceEngineeringPattern detectionEmbedded systemArtificial intelligenceElectrical engineeringPhysicsOpticsChemistryGeneBiochemistryIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsWelding Techniques and Residual Stresses