Qualify a NIR camera to detect thermal deviation during aluminum WAAM
Anthony Dellarre, Nicolas Béraud, Nicolas Tardif, Frédéric Vignat, François Villeneuve, Maxime Limousin
Topics & Concepts
Metric (unit)Standard deviationThermalAluminiumMaterials scienceInfraredSensitivity (control systems)AlloyOpticsMechanical engineeringComposite materialMathematicsEngineeringPhysicsElectronic engineeringThermodynamicsStatisticsOperations managementAdditive Manufacturing Materials and ProcessesWelding Techniques and Residual StressesThermography and Photoacoustic Techniques