Gate-assisted phase fluctuations in all-metallic Josephson junctions
J. Basset, Ognjen Stanisavljević, Marko Kuzmanović, Julien Gabelli, C. H. L. Quay, Jérôme Estève, M. Aprili
Abstract
The authors show that in all-metallic Josephson field effect transistors, the statistics of electron flow due to the gate leakage current is imprinted onto the Josephson switching current and explains its reduction.
Topics & Concepts
Josephson effectCondensed matter physicsPi Josephson junctionTransistorMaterials scienceMetalPhysicsSuperconductivityVoltageQuantum mechanicsMetallurgyQuantum and electron transport phenomenaAdvancements in Semiconductor Devices and Circuit Designstochastic dynamics and bifurcation