Lamellar instabilities during scanning laser melting of Al–Cu eutectic and hypoeutectic thin films
Emmet Sullivan, John A. Tomko, Jonathan M. Skelton, James M. Fitz‐Gerald, Patrick E. Hopkins, Jerrold A. Floro
Topics & Concepts
Eutectic systemLamellar structureMaterials scienceThin filmMicrostructureSputter depositionAlloyComposite materialSputteringNanotechnologySolidification and crystal growth phenomenaAluminum Alloy Microstructure PropertiesMetallic Glasses and Amorphous Alloys