Current-induced degradation process in (In)AlGaN-based deep-UV light-emitting diode fabricated on AlN/sapphire template
Pradip Dalapati, Kosuke Yamamoto, Takashi Egawa, Makoto Miyoshi
Topics & Concepts
Materials scienceCathodoluminescenceOptoelectronicsElectroluminescenceLight-emitting diodeDiodeSapphireDiffractionAnalytical Chemistry (journal)OpticsLaserLuminescenceNanotechnologyChemistryPhysicsLayer (electronics)ChromatographyGaN-based semiconductor devices and materialsGa2O3 and related materialsZnO doping and properties