Reliability Analysis of Field-aged Glass/Glass PV Modules: Influence of Different Encapsulant Types
Prathamesh Manohar Thorat, Shreyas Prasad Waghmare, Archana Sinha, Akash Kumar, GovindaSamy TamizhMani
Abstract
This paper presents a preliminary reliability analysis of field-aged glass/glass (G/G) PV modules. Several characterization tests were performed on more than 60 modules with two different encapsulant types (EVA and ionomer) exposed in hot-dry Arizona (AZ) climate over 10-35 years. The common degradation mode observed in both encapsulant types was the delamination of encapsulant along with encapsulant browning (EVA only), glass cracking (EVA only), and metallic corrosion over junction box area (ionomer only). The EVA encapsulated G/G modules showed the higher median power degradation rate at 0.91-1.99%/yr whereas modules with ionomer showed the lower at 0.21%/yr.