Cascading failures modeling of electronic circuits with degradation using impedance network
Yi Jin, Qingyuan Zhang, Yunxia Chen, Zhendan Lu, Tianpei Zu
Topics & Concepts
Cascading failureSpiceReliability (semiconductor)Electrical impedanceDegradation (telecommunications)Computer scienceElectronic circuitElectronic engineeringReliability engineeringEngineeringElectrical engineeringElectric power systemPower (physics)PhysicsQuantum mechanicsAdvancements in Semiconductor Devices and Circuit DesignRadiation Effects in ElectronicsLow-power high-performance VLSI design