Membrane Thickness Impact on Chemical Degradation Rates
Frank D. Coms, Ashley B. McQuarters, Craig S. Gittleman, Alex Marks
Abstract
A comprehensive investigation of PFSA membrane chemical degradation rates as a function of thickness (8–20 μm) is reported. The two-pronged study was conducted on bare membranes and as components of chemically-mitigated and mechanically-reinforced, state-of-the-art (SOA) membrane electrode assemblies (MEAs). The bare membranes were subjected to H 2 O 2 vapor tests and MEAs were degraded under open circuit voltage (OCV) conditions, both at 90 °C. Both test types employed fluoride release rates (FRR) to monitor chemical degradation rates. Vapor tests revealed that area-specific degradation rates were positively correlated with membrane thickness, but thickness normalized degradation rates were independent of thickness. OCV investigations spanning the membrane thickness series of MEAs was probed via a 27-experiment 3 (4–1) fractional factorial experimental design. Statistical analysis of the FRR values revealed that chemical degradation rates were dominated by the relative humidity value and that the area-specific degradation rates of MEAs were independent of membrane thickness. The OCV chemical durability insensitivity to membrane thickness is supported by on-load membrane chemical durability studies at the stack level. The results suggest that,despite smaller ionomer inventory, SOA thin membranes and MEAs are not greatly disadvantaged relative to thicker membranes from a chemical durability perspective, provided oxidative stress levels are controlled throughout application lifetime.