Litcius/Paper detail

Lacunarity exponent and Moran index: A complementary methodology to analyze AFM images and its application to chitosan films

Erveton P. Pinto, Marcelo A. Pires, Robert S. Matos, Robert R.M. Zamora, Rodrigo P. Menezes, Raquel Silva Araújo, Tiago Marcolino de Souza

2021Physica A Statistical Mechanics and its Applications35 citationsDOI

Topics & Concepts

LacunarityMaterials scienceFractalAtomic force microscopyIsotropySierpinski triangleExponentOpticsMathematicsFractal dimensionNanotechnologyPhysicsMathematical analysisLinguisticsPhilosophyNanocomposite Films for Food PackagingSensory Analysis and Statistical MethodsSurface Roughness and Optical Measurements
Lacunarity exponent and Moran index: A complementary methodology to analyze AFM images and its application to chitosan films | Litcius