Towards trustworthy machine fault diagnosis: A probabilistic Bayesian deep learning framework
Taotao Zhou, Te Han, Enrique López Droguett
Topics & Concepts
Artificial intelligenceProbabilistic logicMachine learningComputer scienceDeep learningReliability (semiconductor)TrustworthinessFault (geology)Uncertainty quantificationBayesian probabilityNoise (video)Bayesian networkRisk analysis (engineering)Data miningComputer securityImage (mathematics)SeismologyPower (physics)MedicineGeologyPhysicsQuantum mechanicsMachine Fault Diagnosis TechniquesFault Detection and Control SystemsAnomaly Detection Techniques and Applications