Thickness-dependent properties of ultrathin bismuth and antimony chalcogenide films formed by physical vapor deposition and their application in thermoelectric generators
Jana Andžāne, Andrei Felsharuk, Anatolijs Šarakovskis, Uldis Malinovskis, Edijs Kauranens, Mikhaël Bechelany, Kiryl Niherysh, I. Komissarov, Donāts Erts
Topics & Concepts
Materials sciencePhysical vapor depositionThin filmChemical vapor depositionMicaThermoelectric effectOptoelectronicsChalcogenideSeebeck coefficientMolecular beam epitaxyGrapheneMonolayerVan der Pauw methodDeposition (geology)NanotechnologyEpitaxyLayer (electronics)Composite materialHall effectElectrical resistivity and conductivityThermal conductivitySedimentBiologyThermodynamicsPhysicsElectrical engineeringEngineeringPaleontologyAdvanced Thermoelectric Materials and DevicesTopological Materials and PhenomenaHeusler alloys: electronic and magnetic properties