Deep learning for electron and scanning probe microscopy: From materials design to atomic fabrication
Sergei V. Kalinin, Maxim Ziatdinov, Steven R. Spurgeon, Colin Ophus, Eric A. Stach, Toma Susi, Josh C. Agar, John N. Randall
Topics & Concepts
FabricationNanotechnologyRoboticsArtificial intelligenceScanning probe microscopyScanning electron microscopeComputer scienceMaterials scienceRobotMedicineAlternative medicinePathologyComposite materialForce Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and Applications