Ultrafast formation of topological defects in a two-dimensional charge density wave
Yun Cheng, Alfred Zong, Lijun Wu, Qingping Meng, Wei Xia, Fengfeng Qi, Pengfei Zhu, Xiao Zou, Tao Jiang, Yanfeng Guo, Jasper van Wezel, Anshul Kogar, Michael Zuerch, Jie Zhang, Yimei Zhu, Dao Xiang
Topics & Concepts
Topological defectUltrafast electron diffractionFemtosecondUltrashort pulsePhotoexcitationPhysicsCharge density wavePhononPicosecondTopology (electrical circuits)ExcitationCondensed matter physicsLaserQuantum mechanicsCombinatoricsSuperconductivityMathematicsForce Microscopy Techniques and ApplicationsElectronic and Structural Properties of OxidesAdvanced Chemical Physics Studies