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Emissivity Measurements of Vanadium Dioxide Thin Films through the Thermal Wave Resonant Cavity and its Applications in Radiative Thermal Diode and Transistor Simulations

Irving Alonzo-Zapata, Corinne Champeaux, Franck Enguehard, José Ordoñez-Miranda, Frédéric Dumas-Bouchiat

2024International Journal of Heat and Mass Transfer15 citationsDOI

Topics & Concepts

EmissivityVanadium dioxideMaterials scienceThermalOptoelectronicsDiodeRadiative transferVanadiumThermal radiationInfraredOpticsThin filmThermodynamicsPhysicsNanotechnologyMetallurgyThermal Radiation and Cooling TechnologiesTransition Metal Oxide NanomaterialsThermal properties of materials
Emissivity Measurements of Vanadium Dioxide Thin Films through the Thermal Wave Resonant Cavity and its Applications in Radiative Thermal Diode and Transistor Simulations | Litcius