DDEG: Addressing data scarcity in additive manufacturing defect detection through joint generation of CT images and defect annotations
Rui Han, Yu‐Zhong Wang, Wenhua Guo, Chenwei Wang, Yihui Zhang, Yanyang Zi, Jiyuan Zhao
Topics & Concepts
ScarcityJoint (building)Computer scienceArtificial intelligenceComputer visionEngineeringEconomicsStructural engineeringMicroeconomicsAdditive Manufacturing Materials and ProcessesImage Processing and 3D ReconstructionAdvanced X-ray and CT Imaging