Defect classification on limited labeled samples with multiscale feature fusion and semi-supervised learning
Jiahuan Liu, Fei Guo, Yun Zhang, Binkui Hou, Huamin Zhou
Topics & Concepts
Computer scienceClassifier (UML)Artificial intelligenceBenchmark (surveying)Pattern recognition (psychology)Convolutional neural networkDeep learningVisualizationVisual inspectionMachine learningGeographyGeodesyIndustrial Vision Systems and Defect DetectionWelding Techniques and Residual StressesNon-Destructive Testing Techniques