Error analysis and reflection correction for radiation temperature measurements at high background temperatures
Shan Gao, Chunhui Zhao, Liwei Chen, Jing Jiang, Peifeng Yu, Zezhan Zhang, Chao Wang
Abstract
Abstract Advances in science and technology have increased the demand for greater temperature measurement accuracy. Radiation thermometry is a mature technology that is applicable to various industrial fields. In special environments (e.g. a high ambient temperature), background radiation reflected by the target surface is superimposed with the radiation from the target itself, which affects the measured radiation temperature. In this study, different radiation thermometry methods were evaluated. The errors of single-spectral, colorimetric, and multispectral temperature measurements of targets in a high-temperature environment have been discussed. Based on this, we propose a multi-wavelength temperature measurement method with reflection correction to reduce the impact of high-temperature environment. Experiments show that this method can reduce the uncertainty in the multispectral temperature measurement from 4.16% to 0.26% under the experimental conditions.