Litcius/Paper detail

A system-on-chip solution for deep learning-based automatic fetal biometric measurement

Hyunwoo Cho, Dong‐Ju Kim, Sunyeob Chang, Jinbum Kang, Yangmo Yoo

2023Expert Systems with Applications16 citationsDOI

Topics & Concepts

BiometricsComputer scienceArtificial intelligenceSegmentationBiparietal diameterSørensen–Dice coefficientDeep learningFetal headComputer visionPattern recognition (psychology)Image segmentationGestational ageFetusHead circumferenceBiologyPregnancyGeneticsFetal and Pediatric Neurological DisordersDomain Adaptation and Few-Shot LearningNeonatal and fetal brain pathology