Litcius/Paper detail

Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning

Yi Sheng, Jinda Yan, Minghao Piao

2024Journal of Intelligent Manufacturing12 citationsDOI

Topics & Concepts

EncoderGeneralizationComputer scienceArtificial intelligenceLabeled dataPattern recognition (psychology)Data setSet (abstract data type)Deep learningData miningWaferMachine learningEngineeringMathematicsElectrical engineeringProgramming languageOperating systemMathematical analysisIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques
Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning | Litcius