Design and analysis of radiation hardened 10 T SRAM cell for space and terrestrial applications
Pavan Kumar Mukku, Rohit Lorenzo
Topics & Concepts
Static random-access memorySoft errorMemory cellPhysicsNode (physics)Semiconductor memoryComputer scienceMaterials scienceOptoelectronicsElectronic engineeringVoltageComputer hardwareTransistorEngineeringQuantum mechanicsRadiation Effects in ElectronicsSemiconductor materials and devicesVLSI and Analog Circuit Testing