Litcius/Paper detail

Testing of in-memory-computing memories with 8 T SRAMs

Tsai-Ling Tsai, Jin-Fu Li, Chun‐Lung Hsu, Chi-Tien Sun

2021Microelectronics Reliability13 citationsDOI

Topics & Concepts

Computer scienceIn-Memory ProcessingVon Neumann architectureStatic random-access memorySemiconductor memoryOperandComputer hardwareParallel computingFlat memory modelMemory managementComputing with MemoryInterleaved memoryEmbedded systemMemory mapOperating systemSearch engineWeb search queryInformation retrievalQuery by ExampleAdvanced Memory and Neural ComputingSemiconductor materials and devicesFerroelectric and Negative Capacitance Devices