Use of remote sensing to characterize the phenological development and to predict sweet potato yield in two growing seasons
Danilo Tedesco, Maílson Freire de Oliveira, Adão Felipe dos Santos, Edgard Henrique Costa Silva, Glauco de Souza Rolim, Rouverson Pereira da Silva
Topics & Concepts
Growing degree-dayPhenologyGrowing seasonNormalized Difference Vegetation IndexVegetation (pathology)CropAgronomyYield (engineering)Environmental scienceBiologyMathematicsLeaf area indexMetallurgyPathologyMaterials scienceMedicineRemote Sensing in AgricultureLeaf Properties and Growth MeasurementRemote Sensing and LiDAR Applications