Litcius/Paper detail

2020 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

Christine Vanhoof, Jeffrey R. Bacon, Ursula E. A. Fittschen, László Vincze

2020Journal of Analytical Atomic Spectrometry39 citationsDOI

Abstract

This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.

Topics & Concepts

X-ray fluorescenceMass spectrometrySynchrotronAnalytical Chemistry (journal)X-rayMaterials scienceFluorescence spectrometryGamma ray spectrometryChemistryFluorescencePhysicsOpticsEnvironmental chemistryRadiochemistryChromatographyX-ray Spectroscopy and Fluorescence AnalysisX-ray Diffraction in CrystallographyCrystallography and Radiation Phenomena