Few-shot defect recognition for the multi-domain industry via attention embedding and fine-grained feature enhancement
Yingtao Su, Ping Yan, Junyao Lin, Chao Wen, Yong Fan
Topics & Concepts
Discriminative modelPattern recognition (psychology)Computer scienceArtificial intelligenceFeature (linguistics)EmbeddingClassifier (UML)Feature vectorConvolutional neural networkFeature learningMachine learningPhilosophyLinguisticsIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesDomain Adaptation and Few-Shot Learning