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Frequency-Dependent Admittance Analysis of Au/n-Si Structure with CoSO4-PVP Interfacial Layer

İlke Taşçıoğlu, Ömer Sevgi̇li̇, Yashar Azizian‐Kalandaragh, Ş. Altındal

2020Journal of Electronic Materials32 citationsDOI

Topics & Concepts

DielectricDissipation factorAnalytical Chemistry (journal)ConductivityCapacitanceDipoleChemistryDielectric lossDispersion (optics)Materials scienceElectrolytePolarization (electrochemistry)Condensed matter physicsElectrodeOptoelectronicsOpticsPhysical chemistryOrganic chemistryPhysicsChromatographySemiconductor materials and interfacesSemiconductor materials and devicesDielectric properties of ceramics
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