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Investigating the Impact of Cracks on Solar Cells Performance: Analysis Based on Nonuniform and Uniform Crack Distributions

Mahmoud Dhimish, Vincenzo d’Alessandro, Santolo Daliento

2021IEEE Transactions on Industrial Informatics46 citationsDOIOpen Access PDF

Abstract

The article investigates the detrimental effect of nonuniform and uniform crack distributions over a solar cell in terms of open-circuit voltage ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">${{\bm{V}}_{{{\bf oc}}}}$</tex-math></inline-formula> ), short-circuit current density ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">${{\bm{J}}_{{{\bf sc}}}}$</tex-math></inline-formula> ), and output power, the latter under a wide range of irradiance conditions. The experimental procedure to detect the cracks relies on electroluminescence (EL) imaging, which is nondestructive and requires a relatively low amount of time. The Griddler software is adopted to translate the EL-taken image into <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">${{\bm{V}}_{{{\bf oc}}}}$</tex-math></inline-formula> and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">${{\bm{J}}_{{{\bf sc}}}}$</tex-math></inline-formula> maps. The main findings can be summarized as follows: the nonuniformly and uniformly cracked cells are both jeopardized in terms of output power; the loss corresponding to the cell with nonuniform distribution of cracks is increasingly higher than the uniformly cracked counterpart as the irradiance hitting the cells grows; and all cells affected by nonuniform cracks are severely damaged in terms of fingers and rear busbar, which concur to limit the maximum output current.

Topics & Concepts

NotationElectroluminescenceMathematicsAlgorithmDiscrete mathematicsCombinatoricsMaterials scienceComposite materialArithmeticLayer (electronics)Non-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure AnalysisElectrical Fault Detection and Protection
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