Optimal durations of Weibull reliability tests based on failure counts
Arturo J. Fernández
Topics & Concepts
Reliability (semiconductor)Weibull distributionTest planReliability engineeringMathematical optimizationEngineeringComputer scienceMathematicsStatisticsPower (physics)PhysicsQuantum mechanicsReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsAdvanced Statistical Process Monitoring