Contrast transfer and noise considerations in focused-probe electron ptychography
Colum M. O’Leary, Gerardo Martínez, Emanuela Liberti, M. J. Humphry, Angus I. Kirkland, Peter D. Nellist
Topics & Concepts
PtychographyOpticsOptical transfer functionPhase retrievalDeconvolutionContrast transfer functionPhase-contrast imagingContrast (vision)Spatial frequencyPhysicsNoise (video)Materials scienceComputer scienceDiffractionPhase contrast microscopyFourier transformSpherical aberrationImage (mathematics)Lens (geology)Artificial intelligenceQuantum mechanicsAdvanced X-ray Imaging TechniquesAdvanced Electron Microscopy Techniques and ApplicationsCrystallography and Radiation Phenomena