Electrical instabilities of a-IGZO TFTs under different conditions of bias and illumination stress
Pablo Toledo, I. Hernández, F.J. Hernandez-Cuevas, N. Hernández‐Como
Topics & Concepts
Materials scienceThin-film transistorBiasingStress (linguistics)Amorphous solidTrappingOptoelectronicsHysteresisPolarization (electrochemistry)Threshold voltageIonizationVoltageTransistorComposite materialCondensed matter physicsElectrical engineeringChemistryIonCrystallographyPhysicsEcologyLayer (electronics)BiologyLinguisticsPhilosophyOrganic chemistryEngineeringPhysical chemistryThin-Film Transistor TechnologiesElectrical and Thermal Properties of MaterialsTransition Metal Oxide Nanomaterials