Combined laser-based X-ray fluorescence and particle-induced X-ray emission for versatile multi-element analysis
P. Puyuelo-Valdes, Simon Vallières, M. Salvadori, S. Fourmaux, S. Payeur, Jean-Claude Kieffer, F. Hannachi, P. Antici
Abstract
Abstract Particle and radiation sources are widely employed in manifold applications. In the last decades, the upcoming of versatile, energetic, high-brilliance laser-based sources, as produced by intense laser–matter interactions, has introduced utilization of these sources in diverse areas, given their potential to complement or even outperform existing techniques. In this paper, we show that the interaction of an intense laser with a solid target produces a versatile, non-destructive, fast analysis technique that allows to switch from laser-driven PIXE (Particle-Induced X-ray Emission) to laser-driven XRF (X-ray Fluorescence) within single laser shots, by simply changing the atomic number of the interaction target. The combination of both processes improves the retrieval of constituents in materials and allows for volumetric analysis up to tens of microns and on cm 2 large areas up to a detection threshold of ppms. This opens the route for a versatile, non-destructive, and fast combined analysis technique.