A combined physics of failure and Bayesian network reliability analysis method for complex electronic systems
Bo Sun, Li Yu, Zili Wang, Dezhen Yang, Yi Ren, Qiang Feng
Topics & Concepts
Bayesian networkReliability (semiconductor)Reliability engineeringPhysics of failureInferenceCopula (linguistics)Bayesian probabilityComputer scienceComplex systemBayesian inferenceData miningEngineeringMachine learningArtificial intelligenceMathematicsPower (physics)PhysicsQuantum mechanicsEconometricsReliability and Maintenance OptimizationRisk and Safety AnalysisSoftware Reliability and Analysis Research