Comparing process-based wheat growth models in their simulation of yield losses caused by plant diseases
Simone Bregaglio, Laetitia Willocquet, Kurt Christian Kersebaum, Roberto Ferrise, Tommaso Stella, Thiago Berton Ferreira, Willingthon Pavan, Senthold Asseng, Serge Savary
Topics & Concepts
Powdery mildewCropDSSATSeptoriaYield (engineering)Simulation modelingMildewCrop yieldAgronomyPlant diseaseEnvironmental scienceAgricultural engineeringBiologyMathematicsBiotechnologyHorticultureEngineeringMathematical economicsMaterials scienceMetallurgyWheat and Barley Genetics and PathologyCrop Yield and Soil FertilityGenetics and Plant Breeding